Journal of Advances in Developmental Research

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Stress and Failure Mode Testing for Embedded Systems

Author(s) Soujanya Reddy Annapareddy
Country United States
Abstract Embedded systems are integral to modern technology, driving innovation in industries ranging from automotive to healthcare. Ensuring their reliability under diverse operating conditions is critical. This paper provides a comprehensive guide to stress and failure mode testing for embedded systems, focusing on methodologies to evaluate performance, durability, and fault tolerance. Key topics include identifying stress parameters, simulating operational extremes, and analyzing failure mechanisms to enhance system resilience. Real-world case studies and practical tools are discussed to demonstrate best practices, making this guide invaluable for engineers and researchers aiming to optimize embedded system reliability.
Keywords Embedded systems, stress testing, failure mode analysis, reliability testing, fault tolerance, system durability, performance evaluation, extreme condition simulation, embedded system design, system resilience.
Field Engineering
Published In Volume 14, Issue 2, July-December 2023
Published On 2023-08-08
Cite This Stress and Failure Mode Testing for Embedded Systems - Soujanya Reddy Annapareddy - IJAIDR Volume 14, Issue 2, July-December 2023. DOI 10.5281/zenodo.14615722
DOI https://doi.org/10.5281/zenodo.14615722
Short DOI https://doi.org/g8x3sd
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